PomeLabs
Utils

Node Voltage

Protected power switch and relay driver module for the PomeLabs Core Kit.

The PomeLabs Node Voltage Module (PML-NV-01) is a multi-function power management module — it controls, protects, and isolates in one board. Plug it in and instantly gain a current-limited power switch and a relay driver with built-in flyback protection, all supervised by your Backend MCU.

Revision: v1.0 | Part Number: PML-NV-01 | Series: PomeLabs Core Kit

Node Voltage

Schematic

Node Voltage Schematic

Digital Twin

In the PomeLabs App, the PML-NV-01 module is mirrored as a digital twin in both the Playground and inside any Connect Activity. On connection the module reports its identity and the App reads its position from the netlist. From the App you can set the module's output level.

Loading circuit

Controls — Parameters You Can Set From the App

Output level  ·  toggle, +5 V / GND

Switch the module's output rail between +5 V (VCC) and GND from the App — a single relay set sent over the Connect bus. The underlying power-switch and relay hardware (U1, U2) is described in the Datasheet below.

Datasheet

1. Overview

The PML-NV-01 is organised into two functional layers. The FE Function block contains the active power-management circuitry: U1 (TPS2069EDBVR) is a current-limited, software-controlled USB-class power switch that converts a raw 5V-Module input into a protected 5V-Protected output rail under MCU supervision, while U2 (SZNUD3124LT1G) drives a relay coil (K1) directly from a logic-level GPIO with no external free-wheeling diode required.

This architecture makes the PML-NV-01 the natural bridge between a Backend MCU and any load or node that requires controlled power or galvanic isolation — without any external protection components.

Key characteristics at a glance:

  • U1 (TPS2069EDBVR): active-HIGH 1.5A1.5\,\mathrm{A} continuous-current power switch — built-in soft-start, 70mΩ70\,\mathrm{m\Omega} RDS(on)R_{DS(on)} at 5V5\,\mathrm{V}, output discharge (500Ω500\,\mathrm{\Omega} typ), reverse-current blocking, deglitched FLT flag (8ms8\,\mathrm{ms} typ), and 2.13A2.13\,\mathrm{A} typical short-circuit current limit (±20% accuracy)
  • U2 (SZNUD3124LT1G): automotive-grade integrated low-side N-MOSFET relay driver — internal Zener clamp (34V34\,\mathrm{V} typ, 38V38\,\mathrm{V} max), no external free-wheeling diode required, AEC-Q101 qualified, drives relay coils up to 150mA150\,\mathrm{mA} at 12V12\,\mathrm{V}
  • K1 (G6K-2F-DC5): 5V5\,\mathrm{V} coil DPDT signal relay switched by U2, providing galvanic isolation for the load
  • FLT fault reporting from U1 to Backend MCU via GPIN0 (open-drain, pulled up through R3 4.7kΩ4.7\,\mathrm{k\Omega} to 3V3)
  • C3 (100nF100\,\mathrm{nF}) ceramic input bypass capacitor at U1 IN pin per TI application guidelines
  • Compatible with all modules in the PomeLabs Core Kit

2. BOM Components

Ref.TypeValue / PartRole on this module
U1Power-distribution switchTPS2069EDBVR (TI)Primary power switch. N-channel MOSFET with active-HIGH enable. 1.5A1.5\,\mathrm{A} continuous output, 2.13A2.13\,\mathrm{A} typ short-circuit current limit (±20%). Provides built-in soft-start, output discharge (RDCHGR_{DCHG} = 500Ω500\,\mathrm{\Omega} typ), reverse-current blocking, fast 1.5μs1.5\,\mathrm{\mu s} typ overcurrent response, and 8ms8\,\mathrm{ms} typ deglitched FLT reporting. SOT-23-5 (DBV) package, 2.9×1.6mm2.9 \times 1.6\,\mathrm{mm}.
U2Automotive inductive load driverSZNUD3124LT1G (onsemi)Integrated N-channel MOSFET relay driver with internal 10kΩ10\,\mathrm{k\Omega} gate-to-drain and 100kΩ100\,\mathrm{k\Omega} gate-to-source resistors plus internal Zener clamp (VBR(DSS)V_{BR(DSS)} = 28V28\,\mathrm{V} min, 34V34\,\mathrm{V} typ) — no external free-wheeling diode required. Logic-level gate input (VGS(th)V_{GS(th)} = 1.31.32.0V2.0\,\mathrm{V}). Drives relay coil K1 up to 150mA150\,\mathrm{mA} continuous. AEC-Q101 qualified. SOT-23 (CASE 318) package. Note: marked as DISCONTINUED by onsemi (not recommended for new designs).
K1RelayG6K-2F-DC5 (Omron)5V5\,\mathrm{V} DC coil signal relay switched by U2. Provides galvanic isolation between module logic and switched load. Coil energised when GPOUT1 is driven HIGH by Backend MCU.
C3MLCC bypass capacitor100nF100\,\mathrm{nF}Input bypass on 5V-Module rail at U1 IN pin. Required per TI TPS2069E application guidelines (100nF\geq 100\,\mathrm{nF} ceramic close to IN/GND for local noise decoupling).
R1, R2Resistor4.7kΩ4.7\,\mathrm{k\Omega}Pull-up resistors on UART TX/RX lines to 3V3. Hold the lines at a defined HIGH idle state when no node is connected.
R3Resistor4.7kΩ4.7\,\mathrm{k\Omega}Pull-up resistor from FLT pin of U1 to 3V3. Required because FLT is open-drain — without this resistor the fault flag cannot present a HIGH idle level.

3. Electrical Specifications

All values at 25C25\,\mathrm{{}^\circ C} unless otherwise noted. Specifications from TI SLVSGZ7C (TPS20xxE, Rev. C, March 2025), onsemi NUD3124/D Rev. 15 (SZNUD3124LT1G, June 2024).

3.1 U1 — TPS2069EDBVR

3.1.1 Absolute Maximum Ratings

Exceeding these values may permanently damage the device. Stress ratings only.

ParameterValueUnit
Input voltage (VINV_{IN})0.3-0.3 to 66V
Output voltage (VOUTV_{OUT})0.3-0.3 to 66V
Enable voltage (VENV_{EN})0.3-0.3 to 66V
FLT pin voltage (VFLTV_{FLT})0.3-0.3 to 66V
Continuous output current (IOUTI_{OUT})Internally limited
ESD — Human Body Model (HBM)±2000\pm 2000V
ESD — Charged Device Model (CDM)±500\pm 500V
ESD — IEC 61000-4-2 contact discharge, OUT pin±8000\pm 8000V
ESD — IEC 61000-4-2 air-gap discharge, OUT pin±15000\pm 15000V
Junction temperature (TJT_J)40-40 to +125+125°C
Storage temperature (TstgT_{stg})65-65 to +150+150°C
ParameterMinNomMaxUnit
Input voltage (VINV_{IN})2.72.7555.55.5V
Enable input voltage (VENV_{EN})005.55.5V
Enable high-level input voltage (VIHV_{IH})1.81.8V
Enable low-level input voltage (VILV_{IL})0.80.8V
Continuous output current (IOUTI_{OUT})1.51.5A
FLT sink current (IFLTI_{FLT})001010mA
Junction temperature (TJT_J)40-40125125°C
Ambient operating temperature (TAT_A)40-408585°C
3.1.3 Electrical Characteristics
ParameterMinTypMaxCondition
RDS(on)R_{DS(on)} at VINV_{IN} = 5V5\,\mathrm{V} or 3.3V3.3\,\mathrm{V}7070105105mΩ\mathrm{m\Omega}IOI_O = 1.5A1.5\,\mathrm{A}, TJT_J over full range
RDS(on)R_{DS(on)} at VINV_{IN} = 5V5\,\mathrm{V}8787mΩ\mathrm{m\Omega}IOI_O = 1.5A1.5\,\mathrm{A}, TJT_J = 85C85\,\mathrm{{}^\circ C}
Output rise time (trt_r)0.60.61.51.5ms\mathrm{ms}VINV_{IN} = 5.5V5.5\,\mathrm{V}, CLC_L = 1μF1\,\mathrm{\mu F}, RLR_L = 10Ω10\,\mathrm{\Omega}
Output fall time (tft_f)0.050.050.50.5ms\mathrm{ms} — same conditions as trt_r
Turn-on time (tONt_{ON})33ms\mathrm{ms}CLC_L = 100μF100\,\mathrm{\mu F}, RLR_L = 10Ω10\,\mathrm{\Omega}
Turn-off time (tOFFt_{OFF})33ms\mathrm{ms} — same conditions as tONt_{ON}
Output discharge resistance (RDCHGR_{DCHG})400400500500810810Ω\mathrm{\Omega}VINV_{IN} = VOUTV_{OUT} = 5V5\,\mathrm{V}, disabled
Short-circuit current limit (IOSI_{OS}) at 25C25\,\mathrm{{}^\circ C}1.711.712.132.132.552.55A\mathrm{A}VINV_{IN} = 5V5\,\mathrm{V}, OUT to GND
Short-circuit current limit (IOSI_{OS}) full temp range1.61.62.132.132.662.66A\mathrm{A}VINV_{IN} = 5V5\,\mathrm{V}, OUT to GND
Overcurrent response time (tIOSt_{IOS})1.51.5μs\mathrm{\mu s}VINV_{IN} = 5V5\,\mathrm{V}, RLR_L = 50mΩ50\,\mathrm{m\Omega}
Supply current — disabled (ISDI_{SD}) at 25C25\,\mathrm{{}^\circ C}0.50.511μA\mathrm{\mu A}VENV_{EN} = 0V0\,\mathrm{V}
Supply current — enabled (ISEI_{SE}) at 25C25\,\mathrm{{}^\circ C}9393118118μA\mathrm{\mu A}VENV_{EN} = 5.5V5.5\,\mathrm{V}, IOI_O = 00
UVLO rising threshold222.62.6V\mathrm{V}VINV_{IN} rising
UVLO hysteresis7575mV\mathrm{mV} — at 25C25\,\mathrm{{}^\circ C}
FLT output low voltage (VOLV_{OL})180180mV\mathrm{mV}IFLTI_{FLT} = 5mA5\,\mathrm{mA}
FLT off-state leakage11μA\mathrm{\mu A}VFLTV_{FLT} = 5.5V5.5\,\mathrm{V}
FLT deglitch time (TOC_DEGT_{OC\_DEG})66881212ms\mathrm{ms} — assertion or de-assertion
Thermal shutdown rising threshold155155175175195195°C
Thermal shutdown hysteresis1010°C

3.2 U2 — SZNUD3124LT1G

3.2.1 Absolute Maximum Ratings

Exceeding these values may permanently damage the device. Stress ratings only.

ParameterValueUnit
Drain-to-source voltage (VDSSV_{DSS}) — continuous, TJT_J = 125C125\,\mathrm{{}^\circ C}2828V
Gate-to-source voltage (VGSSV_{GSS}) — continuous, TJT_J = 125C125\,\mathrm{{}^\circ C}1212V
Drain current (IDI_D) — continuous, TJT_J = 125C125\,\mathrm{{}^\circ C}150150mA
Single-pulse drain-to-source avalanche energy (EZE_Z)250250mJ
Peak power dissipation (PPKP_{PK}) — 1ms1\,\mathrm{ms} square pulse2020W
Inductive switching transient (ELD3E_{LD3}) — drain-to-source300300V
Reverse battery (10min10\,\mathrm{min}), drain-to-source14-14V
ESD — Human Body Model (HBM)20002000V
Operating ambient temperature (TAT_A)40-40 to +125+125°C
Junction temperature (TJT_J) — max150150°C
Storage temperature (TSTGT_{STG})65-65 to +150+150°C
Total power dissipation — SOT-23, 25C25\,\mathrm{{}^\circ C}225225mW
Thermal resistance junction-to-ambient (RθJAR_{\theta JA}) — SOT-23556556°C/W
3.2.2 Electrical Characteristics
ParameterMinTypMaxCondition
Drain-to-source sustaining voltage (VBR(DSS)V_{BR(DSS)})282834343838V\mathrm{V}IDI_D = 10mA10\,\mathrm{mA}
Drain-to-source leakage current (IDSSI_{DSS})0.50.5μA\mathrm{\mu A}VDSV_{DS} = 12V12\,\mathrm{V}, VGSV_{GS} = 0V0\,\mathrm{V}, 25C25\,\mathrm{{}^\circ C}
Gate-body leakage current (IGSSI_{GSS})6060nA\mathrm{nA}VGSV_{GS} = 3V3\,\mathrm{V}, VDSV_{DS} = 0V0\,\mathrm{V}, 25C25\,\mathrm{{}^\circ C}
Gate threshold voltage (VGS(th)V_{GS(th)})1.31.31.81.82.02.0V\mathrm{V}VGSV_{GS} = VDSV_{DS}, IDI_D = 1mA1\,\mathrm{mA}
Drain-to-source on-resistance (RDS(on)R_{DS(on)})0.80.8Ω\mathrm{\Omega}IDI_D = 150mA150\,\mathrm{mA}, VGSV_{GS} = 5V5\,\mathrm{V}
Drain-to-source on-resistance (RDS(on)R_{DS(on)})1.41.4Ω\mathrm{\Omega}IDI_D = 150mA150\,\mathrm{mA}, VGSV_{GS} = 3V3\,\mathrm{V}
Output continuous current (IDS(on)I_{DS(on)})150150200200mA\mathrm{mA}VDSV_{DS} = 0.25V0.25\,\mathrm{V}, VGSV_{GS} = 3V3\,\mathrm{V}
High-to-low propagation delay (tPHLt_{PHL})324324ns\mathrm{ns}VDSV_{DS} = 12V12\,\mathrm{V}, VGSV_{GS} = 5V5\,\mathrm{V}
Low-to-high propagation delay (tPLHt_{PLH})12801280ns\mathrm{ns} — same conditions
Rise time (trt_r)725725ns\mathrm{ns}VDSV_{DS} = 12V12\,\mathrm{V}, VGSV_{GS} = 5V5\,\mathrm{V}
Fall time (tft_f)556556ns\mathrm{ns} — same conditions

4. Pin Descriptions

All signal pins are referenced to GND.

Pin / Net NameDirectionDescription
5V-ModulePower In5V5\,\mathrm{V} unregulated input supply. Feeds the IN pin of U1. Must be present and stable before EN is asserted. Also drives the K1 relay coil through the U2 low-side switch.
5V-ProtectedPower OutSwitched, current-limited 5V5\,\mathrm{V} output from U1 OUT pin. Active only when GPOUT0 is HIGH. Protected against short circuits and overcurrent (2.13A{\approx}2.13\,\mathrm{A} typ limit, 1.5A1.5\,\mathrm{A} continuous rating). When U1 is disabled, the output is actively discharged through 500Ω{\approx}500\,\mathrm{\Omega}.
3V3Power In3.3V3.3\,\mathrm{V} logic rail. Supplies the FLT pull-up R3 and the UART pull-ups R1/R2.
GPOUT0InputGPIO from Backend MCU. Drives the EN pin of U1. Pull HIGH (1.8V\geq 1.8\,\mathrm{V}) to enable 5V-Protected; pull LOW (0.8V\leq 0.8\,\mathrm{V}) to disable. Must not be left floating.
GPOUT1InputGPIO from Backend MCU. Drives the Gate of U2 through the internal 10kΩ10\,\mathrm{k\Omega} resistor. Drive HIGH (2.0V\geq 2.0\,\mathrm{V} worst-case to fully turn on) to energise relay coil K1; drive LOW to release the relay.
GPIN0Output (to MCU)Open-drain FLT signal from U1, pulled up to 3V3 through R3 (4.7kΩ4.7\,\mathrm{k\Omega}). Active-LOW; asserted during overcurrent or thermal shutdown. The fault is deglitched by 8ms8\,\mathrm{ms} typ on both edges.
TX_1-L / TX_2-LInputUART transmit from Backend MCU (USART1/USART2), routed to the node-side connectors.
RX_1-L / RX_2-LOutputUART receive from node connectors back to Backend MCU.
GNDGroundCommon ground reference shared across all ICs, the relay coil return path, and all connectors.

5. Connection Guide & Common Errors

Correct power-up sequence:

  1. Connect GND first, ensuring it is shared across the Backend MCU, the PML-NV-01, and any downstream load on the common bus.
  2. Connect 5V-Module to a regulated 5V5\,\mathrm{V} source. U1 remains in shutdown (output disabled, output actively discharged through 500Ω{\approx}500\,\mathrm{\Omega}) until GPOUT0 is asserted HIGH.
  3. Connect the 3V3 rail. This provides bias for the FLT pull-up R3 and the UART pull-ups R1/R2.
  4. After both supplies are stable, drive GPOUT0 HIGH to enable 5V-Protected. Soft-start ramps the output in 0.6ms{\approx}0.6\,\mathrm{ms} typ (1.5ms1.5\,\mathrm{ms} max at VINV_{IN} = 5.5V5.5\,\mathrm{V} into 1μF1\,\mathrm{\mu F} / 10Ω10\,\mathrm{\Omega}).
  5. Drive GPOUT1 HIGH only after the load side is ready. The relay K1 energises in roughly 112ms2\,\mathrm{ms} (typ propagation delay through U2 1.3μs{\approx}1.3\,\mathrm{\mu s}; the rest is mechanical).
  6. Read GPIN0 in firmware to detect FLT events. The signal is debounced internally — a transient overload shorter than 8ms8\,\mathrm{ms} (typ) does not assert FLT, and a fault must persist 8ms8\,\mathrm{ms} (typ) before GPIN0 goes LOW.

Note on FLT timing: the 8ms8\,\mathrm{ms} (6612ms12\,\mathrm{ms}) deglitch window means software cannot rely on FLT to detect very short overcurrent events. Conversely, when clearing a fault by toggling EN, allow the deglitch period to elapse before re-arming the load.

Common wiring errors and consequences:

MistakeSymptomCorrection
EN pin (GPOUT0) left floatingOutput state is undefined per TI; charge-pump bias is unstable; 5V-Protected may glitch on or offAlways drive EN actively from GPOUT0. Tie to GND if the rail must be permanently OFF. EN must not be left open per the TI datasheet.
FLT pull-up R3 missing or rail floatingFLT line never goes HIGH (it is open-drain) — Backend MCU sees a permanent or floating fault and cannot distinguish good from faulted stateConnect R3 = 4.7kΩ4.7\,\mathrm{k\Omega} from FLT to 3V3. 3V3 rail must be live for the pull-up to do its job.
Input bypass C3 too small or absentLocal noise/inrush at turn-on causes VINV_{IN} to dip below the UVLO threshold (2V{\approx}2\,\mathrm{V}) — U1 may UVLO-cycle on power-up; long input cables can also drive VINV_{IN} above the 6V6\,\mathrm{V} absolute max via inductive overshootPlace a 100nF\geq 100\,\mathrm{nF} ceramic capacitor close to IN/GND per TI guideline. For long input cables or noisy supplies, add a 1122μF22\,\mathrm{\mu F} ceramic (or a 10μF10\,\mathrm{\mu F} on OUT) to absorb transients.
5V-Module exceeds 5.5V5.5\,\mathrm{V} (or 6V6\,\mathrm{V} abs max)U1 permanently damagedKeep 5V-Module within the 2.7V2.7\,\mathrm{V}5.5V5.5\,\mathrm{V} recommended operating range. Never exceed 6V6\,\mathrm{V} absolute max.
GPOUT1 high level too low for U2 gateU2 MOSFET does not fully enhance — high RDS(on)R_{DS(on)}, relay may not pull in cleanly, MOSFET dissipates excessive powerVGS(th)V_{GS(th)} is 1.3V1.3\,\mathrm{V} min / 2.0V2.0\,\mathrm{V} max. Drive GPOUT1 3V\geq 3\,\mathrm{V} to guarantee full enhancement; 5V5\,\mathrm{V} is ideal. The internal 10kΩ10\,\mathrm{k\Omega} + 100kΩ100\,\mathrm{k\Omega} network leaves the MOSFET OFF when GPOUT1 floats.
Free-wheeling diode added across K1 coil externallyInductive kickback bypasses the U2 internal Zener clamp, slowing relay drop-out and partially defeating the integrated solutionU2's internal Zener clamp (VBR(DSS)V_{BR(DSS)} = 28V28\,\mathrm{V} min, 34V34\,\mathrm{V} typ) absorbs the kickback by design — no external free-wheeling diode is required or recommended.
Relay coil current exceeds 150mA150\,\mathrm{mA}U2 IDI_D rating exceeded; thermal stress on the SOT-23 (225mW225\,\mathrm{mW} max dissipation)Verify the K1 coil current at the operating supply voltage. The G6K-2F-DC5 has a coil resistance well above 80Ω80\,\mathrm{\Omega}, keeping IDI_D well within spec.
5V-Module and 5V-Protected shorted together externallyBypasses U1's short-circuit protection — the upstream supply sees the load directly with no current limitKeep 5V-Module and 5V-Protected as separate nets. Only U1 bridges them.
Reading FLT immediately after enabling U1False fault reported during the soft-start windowFLT is high-impedance during UVLO, and the 8ms8\,\mathrm{ms} deglitch may not have settled. Wait at least 10ms10\,\mathrm{ms} after asserting EN before sampling GPIN0.
Designing a new product around U2SZNUD3124LT1G is marked "DISCONTINUED — not recommended for new design" by onsemi (NUD3124/D Rev. 15)For new designs, contact onsemi for a recommended replacement (e.g. NCV8402 series or a discrete logic-level MOSFET + flyback diode). The PML-NV-01 retains the part for legacy compatibility only.

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